The very precise measurement of diffracted angles in 4 orientations (every 90°) is transmitted to a special program which calculates the two correction angles for fixation of the ingot on the slicing support. These two angles correspond to a rotation of the ingot on its axis and a small deviation from the slicing support to get the desired cutting angle.
The signal wavelength of 1.5405 A allows to measure the most used semiconductors like Si, Ge, GaAs, ...
The machine can measure ingots from 4 to 10 " diameter and 400 mm max. length.
The goniometer measures angles between 10 to 90 ° with 0.01° resolution.
Diffracted signal given
by a silicon 100 ingot.
